Control Check presents new VAS Probe that measures even in hard-to-reach areas

At the International Industrial Fair in Brno, Control Check is proud to present the state-of-the-art optical measuring instruments from the renowned manufacturer, Micro-Vu. Especially, they will introduce VAS Probe – Vertical Axial Scanner- new innovative sensor, which operates on the principle of distance measurement based on the color spectrum of white light (the "whitelight pen" method). The VAS probe excels in its ability to quickly capture points along the Z-axis. Unlike standard laser systems based on triangulation (angle-based reading), the VAS probe eliminates shadowing issues and allows access even to hard-to-reach areas on the measured object. This makes it an ideal tool for specific and demanding metrological applications.

They will present also 3D Optical Measuring Instruments Micro-Vu (models VERTEX, EXCEL, SOL). These instruments are universal and cost-effective, which is crucial in today's competitive environment. Their uniqueness lies in the ability to combine camera, touch, and laser measurements in one device. This flexibility allows for precise inspection of even the most complex geometric shapes and dimensions. It doesn't matter whether you need to measure tiny details or large components – our instruments provide comprehensive data for your decision-making.

For those seeking fast and reliable solutions for inspecting simpler products, we'll be showcasing our 2D systems - models VF7, VF1, and horizontal HF5. They are ideal for efficient in-production control and help maintain the highest quality with minimal operator demands.